Centralized Core Labs
Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) is a high-resolution surface characterization technique used to investigate surface topography, morphology, and roughness at the nanoscal...
Benchtop Scanning Electron Microscopy (SEM)
Benchtop Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray Spectroscopy (EDS) is an advanced analytical technique used to investigate surface morphology,...
Differential Scanning Calorimetry (DSC)
Differential Scanning Calorimetry (DSC) and Thermogravimetric Analysis (TGA) are advanced thermal analysis techniques used to investigate the thermal properties, stabi...
ENERGY DISPERSIVE X-RAY FLUORESCENCE (ED-XRF) A...
XRF is capable of obtaining chemical information from both bulk solids and liquids. The results obtained are quantifiable down to ppm levels in an efficient manner.
Field Emission Transmission Electron Microscopy...
Transmission Electron Microscopy (TEM) is an advanced high-resolution imaging technique used to investigate the internal structure, morphology, and crystallographic pr...
Field Emission Transmission Electron Microscopy...
Transmission Electron Microscopy (TEM) is a high-resolution imaging technique used to investigate the internal structure, morphology, and crystallographic properties o...
Focused Ion Beam–Scanning Electron Microscopy (...
Focused Ion Beam–Scanning Electron Microscopy (FIB-SEM) is an advanced material characterization and specimen preparation technique that combines high-resolution elect...
Micro X-ray Fluorescence (Micro-XRF)
Micro X-ray Fluorescence (Micro-XRF) is a non-destructive analytical technique used to determine the elemental composition and spatial distribution of elements in soli...
Optical Microscope
Optical Microscopy is a versatile imaging technique used to examine the surface morphology, microstructure, and physical characteristics of materials. The Leica DM6000...
Scanning Electron Microscopy (SEM) JEOL JSM-6610LV
Scanning Electron Microscopy (SEM) is a high-resolution imaging technique used to investigate surface morphology, microstructure, and elemental composition of material...
Wavelength Dispersive X-ray Fluorescence (WD-XRF)
Wavelength Dispersive X-ray Fluorescence (WD-XRF) is a non-destructive analytical technique used to determine the elemental composition of solid, powder, and liquid sa...
X-RAY DIFFRACTOMETER (XRD) SMARTLAB
X-ray Diffraction (XRD) is a non-destructive analytical technique used to identify crystalline phases, investigate crystal structures, and characterize the crystallogr...
X-RAY DIFFRACTOMETER (XRD) ULTIMA IV
X-ray diffractometer (XRD) with a arrange of attachments. Undertakes powder diffraction with accurate goniometer and a fast solid state detector.
X-RAY Photoelectron Spectroscopy (XPS)
X-ray Photoelectron Spectroscopy (XPS) is a highly sensitive surface analysis technique used to determine the elemental composition, chemical states, and electronic pr...