Core lab Details

Benchtop Scanning Electron Microscopy (SEM)

Benchtop Scanning Electron Microscopy (SEM) with Energy Dispersive X-ray Spectroscopy (EDS) is an advanced characterization technique used to examine the surface structure, morphology, and elemental composition of materials. The Thermo Scientific Phenom XL operates by scanning a focused electron beam across a specimen to generate high-resolution images of surface features, particle morphology, grain structures, fractures, and material defects. Its integrated EDS system detects characteristic X-rays emitted from the specimen, enabling qualitative and quantitative elemental analysis and elemental distribution mapping. The instrument features a compact benchtop design, a large sample chamber, and automated imaging capabilities. It is widely used in materials science, metallurgy, geology, ceramics, nanotechnology, and industrial quality control.

Capabilities

  • High-resolution surface morphology and microstructural imaging

  • Secondary Electron (SE) and Backscattered Electron (BSE) imaging

  • Qualitative and quantitative elemental analysis using EDS

  • Elemental mapping and compositional characterization

  • Point analysis and elemental spectrum acquisition

  • Particle size, shape, and distribution analysis

  • Surface defects, fractures, and grain structure examination

  • Automated imaging and measurement capabilities

  • Applications: Metals, alloys, minerals, ceramics, polymers, coatings, composites, and corrosion products

Facilities

  • Model: Thermo Scientific Phenom XL

  • Manufacturer: Thermo Fisher Scientific

  • Benchtop Scanning Electron Microscope (SEM) equipped with EDS

  • High-resolution electron imaging system

  • Energy Dispersive X-ray Spectroscopy (EDS) detector

  • Secondary Electron (SE) and Backscattered Electron (BSE) imaging capabilities

  • Large sample chamber for accommodating different specimen types

  • Computer-controlled microscope operation and image acquisition

  • Integrated software for elemental spectrum analysis and mapping

  • Qualitative and quantitative elemental composition analysis

  • Digital imaging, particle measurement, and microstructural characterization

 

Location                                                            Equipment In-charge

Core Research Facilities                                   Name: Engr. Ammar Kidher

Building 15 LAB# 2207                                     Phone: 860-2187

                                                                             E-mail: ammar.khalefa@kfupm.edu.sa