Micro X-ray Fluorescence (Micro-XRF) is an advanced elemental analysis technique that uses a focused X-ray beam to identify and characterize the chemical composition of materials. The Bruker M4 TORNADO enables precise elemental mapping and point analysis, allowing the distribution of elements across sample surfaces to be visualized. This technique is non-destructive and requires minimal sample preparation. It is particularly useful for analyzing heterogeneous materials, identifying contaminants, investigating corrosion products, and studying the elemental distribution in geological, metallic, ceramic, and electronic samples.

Capabilities

• Micro X-ray fluorescence elemental analysis

• High-resolution two-dimensional elemental mapping

• Qualitative and quantitative elemental analysis

• Localized point and multi-point analysis

• Non-destructive analysis with minimal sample preparation

• Elemental distribution and contamination identification

• Analysis of heterogeneous and complex materials

• Applications: Minerals, rocks, metals, alloys, ceramics, coatings, corrosion products, and electronic components

Facilities

• Model: Bruker M4 TORNADO

• Manufacturer: Bruker

• Energy Dispersive X-ray Fluorescence (EDXRF) system

• Focused X-ray beam for localized elemental analysis

• Silicon Drift Detector (SDD) technology for X-ray detection

• Automated sample stage for elemental mapping

• Computer-controlled measurement and spectrum acquisition

• Qualitative and quantitative elemental analysis

• Two-dimensional elemental distribution imaging

Location                                                            Equipment In-charge

Core Research Facilities                                   Name: Eng. Awais Malik

Building 15 LAB# 2215                                     Phone: 860-7486

                                                                             E-mail: awais.malik@kfupm.edu.sa