Transmission Electron Microscopy (TEM) is a powerful electron microscopy technique used to examine the internal structure and chemical composition of materials at extremely high magnifications. The JEOL JEM-F200 is a field emission transmission electron microscope that operates by transmitting a focused, high-energy electron beam through an ultrathin specimen. It supports conventional Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM), enabling detailed investigation of crystal structures, lattice defects, grain boundaries, nanoparticles, and material interfaces. Electron diffraction techniques provide crystallographic information, while compatible analytical detectors enable elemental characterization. The instrument is widely used in materials science, nanotechnology, metallurgy, semiconductor research, ceramics, catalysts, and advanced functional materials.

Capabilities

• High-resolution TEM and STEM imaging

• Atomic-scale structural and microstructural characterization

• Crystal structure and lattice fringe analysis

• Selected Area Electron Diffraction (SAED)

• Nanoparticle size, shape, and morphology analysis

• Grain boundary, crystal defect, and interface characterization

• Elemental analysis and mapping using EDS when equipped

• High-angle annular dark-field STEM imaging (HAADF-STEM) when configured

• Thin-film and nanomaterial structural characterization

• Applications: Nanomaterials, metals, alloys, ceramics, semiconductors, catalysts, composites, and advanced functional materials

Facilities

• Model: JEOL JEM-F200

• Manufacturer: JEOL Ltd.

• Field Emission Transmission Electron Microscope (FE-TEM)

• Electron accelerating voltage up to 200 kV

• Field emission electron gun for high-brightness electron illumination

• Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) capabilities

• High-resolution imaging and electron diffraction analysis

• Selected Area Electron Diffraction (SAED) system

• Computer-controlled microscope operation and digital image acquisition

• Advanced software for image processing and microstructural characterization

• Analytical elemental characterization with compatible EDS instrumentation

Location                                                            Equipment In-charge

Core Research Facilities                                   Name: Mr. Mohamed Javid

Building 426 (Consulate) LAB# 1                    Phone: 860-8661

                                                                             E-mail: m.mohamednazar@kfupm.edu.sa