Field Emission Transmission Electron Microscopy (TEM) JEOL JEM-2100Plus
Transmission Electron Microscopy (TEM) is an advanced electron microscopy technique used to examine the internal structure and microstructural properties of materials at very high magnifications. The JEOL JEM-2100Plus operates by transmitting a high-energy electron beam through an ultrathin specimen, producing high-resolution images that reveal nanoscale structural features. This technique enables the investigation of crystal structures, lattice defects, grain boundaries, particle morphology, and material interfaces. Electron diffraction analysis provides valuable information about crystallographic orientation and phase identification. TEM is widely used in nanotechnology, materials science, metallurgy, semiconductor research, ceramics, and advanced materials characterization.
Capabilities
High-resolution transmission electron microscopy imaging
Nanoscale and atomic-scale structural characterization
Crystal structure and crystallographic orientation analysis
Selected Area Electron Diffraction (SAED)
Nanoparticle size, shape, and morphology analysis
Grain boundary, lattice defect, and interface characterization
Thin-film and nanomaterial microstructural analysis
Applications: Nanomaterials, metals, alloys, ceramics, semiconductors, polymers, and advanced functional materials
Facilities
Model: JEOL JEM-2100Plus
Manufacturer: JEOL Ltd.
High-resolution Transmission Electron Microscope (TEM)
Electron accelerating voltage up to 200 kV
High-magnification imaging of ultrathin specimens
Electron diffraction system for crystallographic analysis
Computer-controlled image acquisition and processing
Digital imaging and microstructural analysis
Selected Area Electron Diffraction (SAED) capability
High-resolution analysis of nanoparticles, thin films, and crystalline materials
Location Equipment In-charge
Core Research Facilities Name: Engr. Sidra Nayer
Building 15 LAB# 2201 Phone: 860-5234
E-mail: sidra.bukhari@kfupm.edu.sa