All Centralized Core Labs

Centralized Core Labs

ENERGY DISPERSIVE X-RAY FLUORESCENCE (ED-XRF) A...

XRF is capable of obtaining chemical information from both bulk solids and liquids. The results obtained are quantifiable down to ppm levels in an efficient manner.

Field Emission Scanning Electron Microscope/Ene...

Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances.

Field Emission Transmission Electron Microscope

The JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope.

NANOINDENTER AND MICROSCRATCH TESTER

Nanoindenter is used to determine hardness of materials at loads as small as 0.5 mN. It can be used to study indentation elastic modulus, creep and fracture toughness.

PIN-ON-DISC TRIBOMETER/PROFILOMETER

A fully automated Pin-on-Disk Tribometer and Wear Profilometer for measuring friction and wear properties of materials.

Scanning Electron Microscopy/Energy Dispersive ...

Scanning electron microscope (SEM) provides a high depth of field at large magnifications permitting a detailed study of the surface topography of materials. Examinati...

XRAY DIFFRACTOMETER (XRD)

X-ray diffractometer (XRD) with a arrange of attachments. Undertakes powder diffraction with accurate goniometer and a fast solid state detector.