Core lab Details

Scanning Electron Microscopy (SEM) JEOL JSM-6610LV

Scanning Electron Microscopy (SEM) is an advanced electron microscopy technique used to characterize the surface structure, morphology, and microstructural properties of materials. The JEOL JSM-6610LV operates by scanning a focused electron beam across the sample surface and detecting signals generated through electron–sample interactions. It provides high-resolution images revealing surface features, particle morphology, grain structures, fractures, and material defects. The instrument supports both high-vacuum and low-vacuum operating modes, allowing the examination of conductive and certain non-conductive specimens with reduced sample preparation. When integrated with Energy Dispersive X-ray Spectroscopy (EDS), the system enables qualitative and quantitative elemental analysis. SEM is widely used in materials science, metallurgy, geology, ceramics, nanotechnology, and industrial failure analysis.

Capabilities

  • High-resolution surface morphology and topography imaging

  • Microstructural characterization of materials

  • Secondary Electron (SE) and Backscattered Electron (BSE) imaging

  • High-vacuum and low-vacuum sample analysis

  • Particle size, shape, and distribution analysis

  • Grain structure, fracture surface, and defect examination

  • Qualitative and quantitative elemental analysis using EDS

  • Elemental mapping and compositional characterization

  • Applications: Metals, alloys, minerals, ceramics, polymers, coatings, composites, and corrosion products

Facilities

  • Model: JEOL JSM-6610LV

  • Manufacturer: JEOL Ltd.

  • Scanning Electron Microscope (SEM) with low-vacuum capability

  • Electron accelerating voltage range of 0.3–30 kV

  • Secondary Electron (SE) and Backscattered Electron (BSE) imaging capabilities

  • Energy Dispersive X-ray Spectroscopy (EDS) system

  • High-vacuum and low-vacuum operating modes

  • Computer-controlled image acquisition and processing

  • Elemental spectrum acquisition and compositional analysis

  • Digital imaging and microstructural characterization

 

Location                                                            Equipment In-charge

Core Research Facilities                                   Name: Mr. Hatim Dafalla Mohamed Dafalla

Building 15 LAB# 2203                                     Phone: 860-3545

                                                                             E-mail: dmhatim@kfupm.edu.sa