Optical Microscopy is a widely used materials characterization technique that utilizes visible light and precision optical lenses to magnify and examine the surface features and microstructural properties of materials. The Leica DM6000 M is an advanced research-grade optical microscope designed for detailed inspection and analysis of metallic, ceramic, semiconductor, and other material specimens. It supports multiple illumination and contrast techniques, including brightfield, darkfield, polarized light, and differential interference contrast (DIC), depending on the installed configuration. Integrated with Leica Application Suite X (LAS X) software, the system enables digital image acquisition, measurement, documentation, and microstructural analysis. Optical microscopy is widely used in metallography, materials science, failure analysis, semiconductor inspection, coating evaluation, and industrial quality control.

Capabilities

• High-resolution optical imaging and surface inspection

• Microstructural and metallographic characterization

• Grain size, shape, and distribution analysis

• Surface defects, cracks, and fracture examination

• Coating thickness and cross-sectional analysis

• Brightfield and darkfield optical imaging

• Polarized light and differential interference contrast (DIC) imaging, where configured

• Digital image acquisition and dimensional measurements

• Applications: Metals, alloys, ceramics, polymers, coatings, semiconductors, composites, and industrial materials

Facilities

• Model: Leica DM6000 M

• Manufacturer: Leica Microsystems

• Advanced research-grade optical microscope

• Motorized microscope platform for precise imaging and positioning

• High-quality optical system for detailed material examination

• Reflected-light illumination for opaque material samples

• Multiple optical contrast techniques, depending on configuration

• Digital camera system for image acquisition and documentation

• Leica Application Suite X (LAS X) imaging and analysis software

• Computer-controlled imaging and measurement capabilities

• Surface morphology, grain structure, and dimensional analysis

• Metallographic examination and coating characterization

Location                                                            Equipment In-charge

Core Research Facilities                                   Name: Ms. Gadeer Alonizan

Building 15 LAB# 2205                                     Phone: 860-5356

                                                                              E-mail: gadeer.onizan@kfupm.edu.sa