X-ray diffractometer (XRD) with a arrange of attachments. Undertakes powder diffraction with accurate goniometer and a fast solid state detector. X-ray diffraction undertakes material characterization by phase identification and hence is an important tool to support chemical information obtained by other techniques. XRD can also be used to study crystal structure, lattice parameter, residual stress and texture, thin films, crystallinity, grain size, pore size, etc.

Capabilities

• Powder diffraction, automated overnight analysis, multiple sample analysis
• PDF database, Peak search, RIR and Rietveld analysis
• Stress and texture measurement, Crystallinity, grain size
• Thin film analysis, small angle scattering (SAXS)
• High temperature (1600 °C) Capillary attachment
• Applications: rock minerals, clays, optical films, protective coatings, alloys, ceramics, polymers

Facilities

• Models: Rigaku Ultima IV and JEOL JDX 3530
• 40kV x-ray tube,  radiation safe enclosure, water chiller
• Monochromator, solid state fast detector, Multiple configuration setup
• Modular component setup, plug and play attachments
• Automated multiple sample holder
• Windows based PC software

Location Scientist In-charge

Center for Engineering Research Name: Mr. Fuad K. Al-Yusef

Phone: 860-4267 Phone: 860-4462

Building 15 Room#2217 E-mail: fkyousef@kfupm.edu.sa