The JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope.

The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample.

Study microstructure, microchemical analysis and electron diffraction

Examine nano-areas, CNTs, grain boundary regions, fine particles, dislocations and lattice defects.

Capabilities

• TEM Imaging (Lattice Resolution: 0.14 nm)
• STEM Imaging (HAADF STEM Resolution: 0.19 nm)
• Phase Plate (PP)
• 100 mm² EDS for Elemental Analysis
• 20MP High Sensitivity CMOS CameraAccelerating Voltage kV: 200kV
• TEM Magnification range: x20  to  x1.5 Million
• STEM Magnification range: x100  to  x150 Million
• Cryo-Holder, Cryo-plunger, Turbo Pumping station, Plasma Cleaner
• Cryo-Ultramicrotome

Facilities

• FEG featuring a high brightness and a high stability realizes structural scanning imaging at atomic resolution.
• ultimately sensitive analysis of a sample at sub-nanometer resolution.
• the electron holography that requires the highly coherent illumination is available for this microscope with an optional equipment electron bi-prism
• The stable specimen driving system allows the specimen to perform tilt and/or shift with an ultra low drift and vibration.
• system accepts variety of specimen holders, various physical conditions of specimen such as temperature or rotation or tilt can be changeable

Location                                                          Scientist In-charge

Center for Engineering Research                  Name: Mr. Hatim Dafalla Mohamed

Phone: 860-4957                                              Phone: 860-3545