Field Emission Scanning Electron Microscope (FE-SEM) provides ultra-high resolution imaging at low accelerating voltages and small working distances. Allows examination of Nano-powders, carbon nanotubes and thin films at 1 nm resolution. Energy dispersive x-ray spectroscopy (EDS) coupled with SEM is used to determine chemical composition of micro-features. Beam deceleration to reduce charging effects.

Capabilities

• Imaging resolution of 1 nm at 15kV
• Beam deceleration to image surface features
• Secondary electron imaging, surface topography of materials
• Backscattered imaging of un-etched surfaces
• Low vacuum mode to examine non-conducting samples such as polymers
• Microchemical analysis of microstructural features such precipitates, phases, etc

Facilities

• Model FEI Nova Nano SEM 230 - Field emission gun, 5 axis automated/manual stage, multiple sample holder, secondary and backscattered electron detectors, low voltage high contrast detector, solid state back scattered detector, low vacuum detector, Infra-red camera
• Multi-quadrant simultaneous imaging, mixed imaging, low working distance, low accelerating voltage imaging
• 1 nm imaging resolution at 15kV
•  EDS detector for microchemical analysis

Location                                                          Scientist In-charge

Core Research Facilities                                 Name: Dr. Muhammad Younas

Phone: 860-4956                                             Phone: 860-xxx