XRF is capable of obtaining chemical information from both bulk solids and liquids. The results obtained are quantifiable down to ppm levels in an efficient manner. Irradiated area of a sample is much larger than that in an SEM. Sample preparation is important. This technique is not sensitive to light element analysis. It is effective starting Al in the periodic table. It is used in combination with SEM and XRD for materials analysis.

Capabilities

• Energy dispersive XRF, Large sample area analysis
• Dry and liquid samples analysis
• Automated multiple sample analysis
• Sensitivity down to ppm levels
• Integrated with PC
• Applications: Analysis of rock minerals, deposits, corrosion products, bulk alloys, oil.

Facilities

• Model: JEOL JSX 3201
• Rh tube, Analysis in vacuum for increased sensitvity
• Computer controlled, automated EDS spectrum generation, peak search
• Qualitative and standardless semi-quantitative analysis

Location                                                            Scientist In-charge

Center for Engineering Research                   Name: Dr. Izzat Kazi

Phone: 860-4956                                               Phone: 860-8328

Building 15 Room#2203                                  E-mail: iwkazi@kfupm.edu.sa